释义 |
rheed 基本例句 =Reflection High Energy Electron Diffraction 反射高能电子衍射 The quality of buffer layer and thin films was analyzed by AFM, XRD, RHEED and XPS respectively.采用原子力显微镜、X射线衍射、反射高能电子衍射和X射线光电子能谱等表征方法,对碳化层的质量和3C-SiC薄膜的结构进行了表征。 The growth was monitored in-situ by reflection high-energy electron diffraction.在超晶格薄膜生长过程中采用反射高能电子衍射对LaAlO3/BaTiO3/SrTiO3超晶格的生长过程进行了分析。 The growth surfaces of fihns were monitoring in situ by reflective high-energy electron diffraction in the whole process.在整个实验过程中,用反射高能电子衍射原位监测膜生长。 |