| 释义 |
Atomic force microscopes
基本例句
原子力显微镜
Similar to a cantilever in atomic force microscopes, it would be sensitive enough to detect the push felt by the mirror.这支振荡臂类似于原子力显微镜中的悬臂，必须非常灵敏，可侦测出镜面受到的推力。
In examining samples, we measured composition and bonding by Chemical analyzer and Raman spectrum, and measured surface by Atomic Force Microscope.在试片的检测部份，我们利用了化学分析电子仪及拉曼光谱仪分析薄膜之元素组成及其键结，并且用原子力显微镜观察其表面形貌。 |