| 释义 |
ellipsometry 英elɪp'sɒmɪtrɪ美ɪlep'sɒmətrɪ BNC¹⁴⁴⁶⁶⁴⁺³
基本例句
n.椭圆光度法⁷⁵;椭圆对称法²⁵
A protein microarray biosensor based on imaging ellipsometry has been developed as a high- throughput and fast technique for protein analysis.
椭偏光学生物传感器是识别和检测蛋白质的一种新型的高通量、快速生物分子分析技术。 cnki
According to comparing with simulation annealing algorithm the paper introduce very fast simulation annealing algorithm and use VFSA to compute the ellipsometry data.
对比模拟退火算法介绍了非常快速模拟退火算法的流程，并使用非常模拟退火算法计算了椭偏数据。 cnki
After mathematical treatments of ellipsometry basic equations, unknown parameters can be obtained directly from measured data by means of the microcomputer.
对椭偏术基本方程进行数学处理，应用微型计算机可由测量值直接求得未知参数。 cnki
Angle of incidence and wave length for ellipsometry method were studied.
对椭圆偏振法的入射角和波长进行了探讨。 cnki
The optical properties in visible range of amorphous silicon have been measured by spectroscopic ellipsometry.
利用椭圆偏振光谱仪测定了无定形硅在可见光范围的光学常数。 cnki
The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopyIR and quasi- steady state photoconductance QSSPC measurements.
利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导 QSSPC分析了氮化硅薄膜的特性。 cnki
The feasibility of using protein A to immobilize antibody on the silicon surface of the imaging ellipsometry biosensor was investigated in this study.
研究了在硅片表面上通过 A蛋白定向固定抗体分子用于椭偏光学生物传感器免疫检测的可能性。 dictall
The structure of the laser crystallized poly- Si thin film is analyzed by using spectroscopic ellipsometry.
采用椭偏光谱法分析了薄膜的结构，并提出多层膜模型模拟薄膜结构。 cnki
To attain high precise optical parameters of thin films, it's necessary to solve data processing in ellipsometry.
数据处理一直是椭偏测量术获取高精度薄膜结构参数的一个难点。 dictall
A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced.
探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性。 zidian8
Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.
结合激光外差干涉法和透射式椭偏测量原理，研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。 dictall
Experiment result from imaging ellipsometry system demonstrates its availability and its precision reaches micron order.
该方法在椭偏成像系统的应用结果验证了其有效性，调焦精度达到微米量级。 cnki
In this paper, the application of ellipsometry to the study of corrosion of metals is summarily described.
本文对椭园法在金属腐蚀研究中的应用作了概括的介绍。 cnki
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。 cnki
Spectroscopic ellipsometry is a useful technique for studying surfaces and thin films.
椭圆偏振光谱因其独特的优点广泛应用于薄膜科学和技术中。 opticsjournal
The experimental results show that the ellipsometry with a new parameter VOP could be analyzed qualitatively for the electrochemical systems effectively.
用新物理量 Vop的椭圆法定性地分析电化学体系已十分有效。 cnki
The basic principle of ellipsometry, the technical problem applied it to the corrosion study have been introduced.
本文着重介绍了椭偏术的基本原理及其在腐蚀研究领域中应用的技术问题及解决方法。 cnki
The measuring condition for principle angle in spectroscopic ellipsometry is analyzed.
对椭圆偏振光谱中的主角测量条件进行了分析。 cnki
Then the optical properties were performed by alterable angle ellipsometry. And the effect of producing conditions to optical properties at visible region was discussed.
并采用可变入射角椭圆偏振光谱仪对其中一些薄膜的光学性质进行了分析，研究了制备条件对薄膜在可见光范围内光学性质的影响； cnki
Thickness and refractive index was measured by ellipsometry for the film deposited on K9 glass.
用椭偏法测量沉积在 K9玻璃上的膜的厚度和折射率； cnki
This paper describes the principles of the determination of the thick- ness and refractive index of a transparent thin film by ellipsometry. The computational programme is also given.
本文叙述了用椭园偏振法测定透明薄膜厚度和折射率的原理，提供了一个计算程序。 cnki
This method can easily avoid false solutions and get accurate and steady values. It is one of the effective and feasible methods to improve ellipsometry precision.
此方法能有效避开伪解、得到高精度的稳定真值，是提高椭偏测量精度的有效方法之一。 cnki
Through the establishment of different physical and dispersion models, The effects of the surface and interface on spectroscopic ellipsometry were inspected.
通过建立不同的物理和色散模型，分别考察了薄膜表面和界面的椭偏效应。 dictall
Using spectroscopic ellipsometry, the influence of thermal annealing on optical properties of the plasma- deposited hydrogenated amorphous carbon films is investigated.
用椭圆偏振光谱法研究了热处理对射频辉光放电淀积的氢化非晶碳膜光学性质的影响。 cnki
Ellipsometry, A. C. impedance and potential measurements have been used to study the dissolution behaviour and corrosion resistance of titanium anodic oxide film in0.5N sulfuric acid.
本文用椭园法、交流阻抗及电位测量研究了钛阳极氧化膜在0.5N硫酸中的溶解规律和耐蚀性。 cnki
Ellipsometry is an important measuring method for the thin film physics and the science of the solid surface.
椭偏术是薄膜物理和表面科学的重要测量方法。 cnki |